Oxidation of rubrene thin films : an electronic structure study
The performances of organic semiconductor devices are crucially linked with their stability at the ambient atmosphere. The evolution of electronic structures of 20 nm thick rubrene films exposed to ambient environment with time has been studied by UV and X-ray photoemission spectroscopy (UPS and XPS...
Ausführliche Beschreibung
Bibliographische Detailangaben
| Veröffentlicht in: | Langmuir : the ACS journal of surfaces and colloids. - 1992. - 30(2014), 51 vom: 30. Dez., Seite 15433-41
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| 1. Verfasser: |
Sinha, Sumona
(VerfasserIn) |
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| Weitere Verfasser: |
Wang, C-H,
Mukherjee, M,
Mukherjee, T,
Yang, Y-W |
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| Format: | Online-Aufsatz
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| Sprache: | English |
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| Veröffentlicht: |
2014
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| Zugriff auf das übergeordnete Werk: | Langmuir : the ACS journal of surfaces and colloids
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| Schlagworte: | Journal Article |
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