Photon statistics and speckle visibility spectroscopy with partially coherent X-rays

A new approach is proposed for measuring structural dynamics in materials from multi-speckle scattering patterns obtained with partially coherent X-rays. Coherent X-ray scattering is already widely used at high-brightness synchrotron lightsources to measure dynamics using X-ray photon correlation sp...

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Publié dans:Journal of synchrotron radiation. - 1994. - 21(2014), Pt 6 vom: 01. Nov., Seite 1288-95
Auteur principal: Li, Luxi (Auteur)
Autres auteurs: Kwaśniewski, Paweł, Orsi, Davide, Wiegart, Lutz, Cristofolini, Luigi, Caronna, Chiara, Fluerasu, Andrei
Format: Article en ligne
Langue:English
Publié: 2014
Accès à la collection:Journal of synchrotron radiation
Sujets:Journal Article Research Support, U.S. Gov't, Non-P.H.S. partially coherent X-rays photon statistics speckle visibility spectroscopy