Revisit to diffraction anomalous fine structure

The diffraction anomalous fine structure (DAFS) method that is a spectroscopic analysis combined with resonant X-ray diffraction enables the determination of the valence state and local structure of a selected element at a specific crystalline site and/or phase. This method has been improved by usin...

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Détails bibliographiques
Publié dans:Journal of synchrotron radiation. - 1994. - 21(2014), Pt 6 vom: 01. Nov., Seite 1247-51
Auteur principal: Kawaguchi, T (Auteur)
Autres auteurs: Fukuda, K, Tokuda, K, Shimada, K, Ichitsubo, T, Oishi, M, Mizuki, J, Matsubara, E
Format: Article en ligne
Langue:English
Publié: 2014
Accès à la collection:Journal of synchrotron radiation
Sujets:Journal Article Research Support, Non-U.S. Gov't diffraction anomalous fine structure logarithmic dispersion relation non-iterative method powder diffraction site specification
Description
Résumé:The diffraction anomalous fine structure (DAFS) method that is a spectroscopic analysis combined with resonant X-ray diffraction enables the determination of the valence state and local structure of a selected element at a specific crystalline site and/or phase. This method has been improved by using a polycrystalline sample, channel-cut monochromator optics with an undulator synchrotron radiation source, an area detector and direct determination of resonant terms with a logarithmic dispersion relation. This study makes the DAFS method more convenient and saves a large amount of measurement time in comparison with the conventional DAFS method with a single crystal. The improved DAFS method has been applied to some model samples, Ni foil and Fe3O4 powder, to demonstrate the validity of the measurement and the analysis of the present DAFS method
Description:Date Completed 30.03.2015
Date Revised 12.05.2024
published: Print-Electronic
Citation Status PubMed-not-MEDLINE
ISSN:1600-5775
DOI:10.1107/S1600577514015148