X-ray photon correlation spectroscopy studies of surfaces and thin films

Bibliographische Detailangaben
Veröffentlicht in:	Advanced materials (Deerfield Beach, Fla.). - 1998. - 26(2014), 46 vom: 10. Dez., Seite 7764-85
1. Verfasser:	Sinha, Sunil K (VerfasserIn)
Weitere Verfasser:	Jiang, Zhang, Lurio, Laurence B
Format:	Online-Aufsatz
Sprache:	English
Veröffentlicht:	2014
Zugriff auf das übergeordnete Werk:	Advanced materials (Deerfield Beach, Fla.)
Schlagworte:	Journal Article X-ray photon correlation spectroscopy capillary waves liquid surfaces polymer films surface dynamics

Beschreibung
Zusammenfassung:	© 2014 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim. The technique of X-ray Photon Correlation Spectroscopy (XPCS) is reviewed as a method for studying the relatively slow dynamics of materials on time scales ranging from microseconds to thousands of seconds and length scales ranging from microns down to nanometers. We focus on the application of this technique to study dynamical fluctuations of surfaces, interfaces and thin films. We first discuss instrumental issues such as the effects of partial coherence (or alternatively finite instrumental resolution) and optimization of signal-to-noise ratios in the experiments. We then review what has been learned from recent XPCS studies of capillary wave fluctuations on liquid surfaces and polymer films, of nanoparticles used as probes to study the interior dynamics of polymer films, of liquid crystals and multilamellar surfactant films, and of metal surfaces, and magnetic domain wall fluctuations in antiferromagnets. We then discuss studies of non-equilibrium dynamics described by 2-time correlation functions. Finally, we briefly speculate on possible future XPCS experiments at new synchrotron sources currently under development including studies of dynamics on time scales down to femtoseconds
Beschreibung:	Date Completed 21.05.2015 Date Revised 30.09.2020 published: Print-Electronic Citation Status PubMed-not-MEDLINE
ISSN:	1521-4095
DOI:	10.1002/adma.201401094