Ptychography with multilayer Laue lenses
Two different multilayer Laue lens designs were made with total deposition thicknesses of 48 µm and 53 µm, and focal lengths of 20.0 mm and 12.5 mm at 20.0 keV, respectively. From these two multilayer systems, several lenses were manufactured for one- and two-dimensional focusing. The latter is real...
Ausführliche Beschreibung
Bibliographische Detailangaben
| Veröffentlicht in: | Journal of synchrotron radiation. - 1994. - 21(2014), Pt 5 vom: 22. Sept., Seite 1122-7
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| 1. Verfasser: |
Kubec, Adam
(VerfasserIn) |
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| Weitere Verfasser: |
Braun, Stefan,
Niese, Sven,
Krüger, Peter,
Patommel, Jens,
Hecker, Michael,
Leson, Andreas,
Schroer, Christian G |
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| Format: | Online-Aufsatz
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| Sprache: | English |
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| Veröffentlicht: |
2014
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| Zugriff auf das übergeordnete Werk: | Journal of synchrotron radiation
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| Schlagworte: | Journal Article
Research Support, Non-U.S. Gov't
X-ray nanofocusing
multilayer Laue lens
ptychography
scanning X-ray microscopy |
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