Ronchi test for characterization of X-ray nanofocusing optics and beamlines
A Ronchi interferometer for hard X-rays is reported in order to characterize the performance of the nanofocusing optics as well as the beamline stability. Characteristic interference fringes yield qualitative data on present aberrations in the optics. Moreover, the visibility of the fringes on the d...
| Publié dans: | Journal of synchrotron radiation. - 1994. - 21(2014), Pt 5 vom: 22. Sept., Seite 1105-9 |
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| Auteur principal: | |
| Autres auteurs: | , , , , , , , |
| Format: | Article en ligne |
| Langue: | English |
| Publié: |
2014
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| Accès à la collection: | Journal of synchrotron radiation |
| Sujets: | Journal Article Research Support, Non-U.S. Gov't Ronchi interferometer compound refractive lens zone plate |
| Résumé: | A Ronchi interferometer for hard X-rays is reported in order to characterize the performance of the nanofocusing optics as well as the beamline stability. Characteristic interference fringes yield qualitative data on present aberrations in the optics. Moreover, the visibility of the fringes on the detector gives information on the degree of spatial coherence in the beamline. This enables the possibility to detect sources of instabilities in the beamline like vibrations of components or temperature drift. Examples are shown for two different nanofocusing hard X-ray optics: a compound refractive lens and a zone plate |
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| Description: | Date Completed 30.03.2015 Date Revised 02.09.2014 published: Print-Electronic Citation Status PubMed-not-MEDLINE |
| ISSN: | 1600-5775 |
| DOI: | 10.1107/S160057751401323X |