Hard X-ray nanofocusing at low-emittance synchrotron radiation sources
X-ray scanning microscopy relies on intensive nanobeams generated by imaging a highly brilliant synchrotron radiation source onto the sample with a nanofocusing X-ray optic. Here, using a Gaussian model for the central cone of an undulator source, the nanobeam generated by refractive X-ray lenses is...
| Veröffentlicht in: | Journal of synchrotron radiation. - 1994. - 21(2014), Pt 5 vom: 22. Sept., Seite 996-1005 |
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| Format: | Online-Aufsatz |
| Sprache: | English |
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2014
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| Zugriff auf das übergeordnete Werk: | Journal of synchrotron radiation |
| Schlagworte: | Journal Article Research Support, Non-U.S. Gov't X-ray nanofocus X-ray optics diffraction-limited storage ring |
| Online verfügbar |
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