Element specific monolayer depth profiling

Element specific monolayer depth profiling

© 2014 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

Bibliographische Detailangaben
Veröffentlicht in:Advanced materials (Deerfield Beach, Fla.). - 1998. - 26(2014), 38 vom: 08. Okt., Seite 6554-9
1. Verfasser: Macke, Sebastian (VerfasserIn)
Weitere Verfasser: Radi, Abdullah, Hamann-Borrero, Jorge E, Verna, Adriano, Bluschke, Martin, Brück, Sebastian, Goering, Eberhard, Sutarto, Ronny, He, Feizhou, Cristiani, Georg, Wu, Meng, Benckiser, Eva, Habermeier, Hanns-Ulrich, Logvenov, Gennady, Gauquelin, Nicolas, Botton, Gianluigi A, Kajdos, Adam P, Stemmer, Susanne, Sawatzky, George A, Haverkort, Maurits W, Keimer, Bernhard, Hinkov, Vladimir
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2014
Zugriff auf das übergeordnete Werk:Advanced materials (Deerfield Beach, Fla.)
Schlagworte:Journal Article Research Support, Non-U.S. Gov't Research Support, U.S. Gov't, Non-P.H.S. complex functional materials depth profiling non-destructive characterization resonant X-ray reflectivity thin film heterostructures
Beschreibung
Zusammenfassung:© 2014 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
The electronic phase behavior and functionality of interfaces and surfaces in complex materials are strongly correlated to chemical composition profiles, stoichiometry and intermixing. Here a novel analysis scheme for resonant X-ray reflectivity maps is introduced to determine such profiles, which is element specific and non-destructive, and which exhibits atomic-layer resolution and a probing depth of hundreds of nanometers
Beschreibung:Date Completed 23.06.2015
Date Revised 30.09.2020
published: Print-Electronic
Citation Status MEDLINE
ISSN:1521-4095
DOI:10.1002/adma.201402028