Retrieval of the atomic displacements in the crystal from the coherent X-ray diffraction pattern

The retrieval of spatially resolved atomic displacements is investigated via the phases of the direct(real)-space image reconstructed from the strained crystal's coherent X-ray diffraction pattern. It is demonstrated that limiting the spatial variation of the first- and second-order spatial dis...

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Veröffentlicht in:Journal of synchrotron radiation. - 1994. - 21(2014), Pt 4 vom: 21. Juli, Seite 774-83
1. Verfasser: Minkevich, A A (VerfasserIn)
Weitere Verfasser: Köhl, M, Escoubas, S, Thomas, O, Baumbach, T
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2014
Zugriff auf das übergeordnete Werk:Journal of synchrotron radiation
Schlagworte:Journal Article Research Support, Non-U.S. Gov't coherent X-ray diffraction imaging phase retrieval strained crystal
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520 |a The retrieval of spatially resolved atomic displacements is investigated via the phases of the direct(real)-space image reconstructed from the strained crystal's coherent X-ray diffraction pattern. It is demonstrated that limiting the spatial variation of the first- and second-order spatial displacement derivatives improves convergence of the iterative phase-retrieval algorithm for displacements reconstructions to the true solution. This approach is exploited to retrieve the displacement in a periodic array of silicon lines isolated by silicon dioxide filled trenches 
650 4 |a Journal Article 
650 4 |a Research Support, Non-U.S. Gov't 
650 4 |a coherent X-ray diffraction imaging 
650 4 |a phase retrieval 
650 4 |a strained crystal 
700 1 |a Köhl, M  |e verfasserin  |4 aut 
700 1 |a Escoubas, S  |e verfasserin  |4 aut 
700 1 |a Thomas, O  |e verfasserin  |4 aut 
700 1 |a Baumbach, T  |e verfasserin  |4 aut 
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