Elucidating the origin of spurious modes in aluminum nitride microresonators using a 2-D finite-element model

In this work, an approach has been developed to predict the location of large spurious modes in the resonant response of aluminum nitride (AlN) microelectromechanical systems (MEMS) resonators over a wide range of desired operating frequencies. This addresses significant challenges in the design of...

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Bibliographische Detailangaben
Veröffentlicht in:IEEE transactions on ultrasonics, ferroelectrics, and frequency control. - 1986. - 61(2014), 5 vom: 16. Mai, Seite 729-38
1. Verfasser: Branch, Darren W (VerfasserIn)
Weitere Verfasser: Wojciechowski, Kenneth E, Olsson, Roy H 3rd
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2014
Zugriff auf das übergeordnete Werk:IEEE transactions on ultrasonics, ferroelectrics, and frequency control
Schlagworte:Journal Article Research Support, U.S. Gov't, Non-P.H.S.