Potentiometric-scanning ion conductance microscopy
We detail the operation mechanism and instrumental limitations for potentiometric-scanning ion conductance microscopy (P-SICM). P-SICM makes use of a dual-barrel probe, where probe position is controlled by the current measured in one barrel and the potential is measured in a second barrel. Here we...
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Détails bibliographiques
| Publié dans: | Langmuir : the ACS journal of surfaces and colloids. - 1985. - 30(2014), 19 vom: 20. Mai, Seite 5669-75
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| Auteur principal: |
Zhou, Yi
(Auteur) |
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| Autres auteurs: |
Chen, Chiao-Chen,
Weber, Anna E,
Zhou, Lushan,
Baker, Lane A |
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| Format: | Article en ligne
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| Langue: | English |
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| Publié: |
2014
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| Accès à la collection: | Langmuir : the ACS journal of surfaces and colloids
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| Sujets: | Journal Article
Research Support, Non-U.S. Gov't
Research Support, U.S. Gov't, Non-P.H.S.
Ions |
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