Potentiometric-scanning ion conductance microscopy
We detail the operation mechanism and instrumental limitations for potentiometric-scanning ion conductance microscopy (P-SICM). P-SICM makes use of a dual-barrel probe, where probe position is controlled by the current measured in one barrel and the potential is measured in a second barrel. Here we...
Ausführliche Beschreibung
Bibliographische Detailangaben
| Veröffentlicht in: | Langmuir : the ACS journal of surfaces and colloids. - 1992. - 30(2014), 19 vom: 20. Mai, Seite 5669-75
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| 1. Verfasser: |
Zhou, Yi
(VerfasserIn) |
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| Weitere Verfasser: |
Chen, Chiao-Chen,
Weber, Anna E,
Zhou, Lushan,
Baker, Lane A |
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| Format: | Online-Aufsatz
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| Sprache: | English |
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| Veröffentlicht: |
2014
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| Zugriff auf das übergeordnete Werk: | Langmuir : the ACS journal of surfaces and colloids
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| Schlagworte: | Journal Article
Research Support, Non-U.S. Gov't
Research Support, U.S. Gov't, Non-P.H.S.
Ions |
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