Robust automatic line scratch detection in films
Line scratch detection in old films is a particularly challenging problem due to the variable spatiotemporal characteristics of this defect. Some of the main problems include sensitivity to noise and texture, and false detections due to thin vertical structures belonging to the scene. We propose a r...
Veröffentlicht in: | IEEE transactions on image processing : a publication of the IEEE Signal Processing Society. - 1992. - 23(2014), 3 vom: 05. März, Seite 1240-54 |
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Format: | Online-Aufsatz |
Sprache: | English |
Veröffentlicht: |
2014
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Zugriff auf das übergeordnete Werk: | IEEE transactions on image processing : a publication of the IEEE Signal Processing Society |
Schlagworte: | Journal Article |
Online verfügbar |
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