Studying the surface reaction between NiO and Al2O3 via total reflection EXAFS (ReflEXAFS)
The reaction between NiO and (0001)- and (1102)-oriented Al2O3 single crystals has been investigated on model experimental systems by using the ReflEXAFS technique. Depth-sensitive information is obtained by collecting data above and below the critical angle for total reflection. A systematic protoc...
Ausführliche Beschreibung
Bibliographische Detailangaben
| Veröffentlicht in: | Journal of synchrotron radiation. - 1994. - 21(2014), Pt 2 vom: 07. März, Seite 395-400
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| 1. Verfasser: |
Costanzo, Tommaso
(VerfasserIn) |
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| Weitere Verfasser: |
Benzi, Federico,
Ghigna, Paolo,
Pin, Sonia,
Spinolo, Giorgio,
d'Acapito, Francesco |
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| Format: | Online-Aufsatz
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| Sprache: | English |
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| Veröffentlicht: |
2014
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| Zugriff auf das übergeordnete Werk: | Journal of synchrotron radiation
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| Schlagworte: | Journal Article
Research Support, Non-U.S. Gov't
ReflEXAFS
epitaxy
non-equilibrium compounds
spinel-forming reactions
topochemistry |
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