In situ micro-focused X-ray beam characterization with a lensless camera using a hybrid pixel detector
Results of studies on micro-focused X-ray beam diagnostics using an X-ray beam imaging (XBI) instrument based on the idea of recording radiation scattered from a thin foil of a low-Z material with a lensless camera are reported. The XBI instrument captures magnified images of the scattering region w...
| Publié dans: | Journal of synchrotron radiation. - 1994. - 21(2014), Pt 2 vom: 07. März, Seite 333-9 |
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| Auteur principal: | |
| Autres auteurs: | , |
| Format: | Article en ligne |
| Langue: | English |
| Publié: |
2014
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| Accès à la collection: | Journal of synchrotron radiation |
| Sujets: | Journal Article Research Support, Non-U.S. Gov't X-ray imaging beam diagnostics beam size measurements micro-focus pinhole camera scattering measurements |
| Accès en ligne |
Volltext |