Critical factors to achieve low voltage- and capacitance-based organic field-effect transistors

© 2013 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

Bibliographische Detailangaben
Veröffentlicht in:Advanced materials (Deerfield Beach, Fla.). - 1998. - 26(2014), 2 vom: 15. Jan., Seite 288-92
1. Verfasser: Jang, Mi (VerfasserIn)
Weitere Verfasser: Park, Ji Hoon, Im, Seongil, Kim, Se Hyun, Yang, Hoichang
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2014
Zugriff auf das übergeordnete Werk:Advanced materials (Deerfield Beach, Fla.)
Schlagworte:Journal Article Research Support, Non-U.S. Gov't conjugation low-voltage operation organic field-effect transistors pentacene trap triethylsilylethynyl anthradithiophene (TES-ADT)
LEADER 01000naa a22002652 4500
001 NLM234281553
003 DE-627
005 20231224100933.0
007 cr uuu---uuuuu
008 231224s2014 xx |||||o 00| ||eng c
024 7 |a 10.1002/adma.201303388  |2 doi 
028 5 2 |a pubmed24n0781.xml 
035 |a (DE-627)NLM234281553 
035 |a (NLM)24403114 
040 |a DE-627  |b ger  |c DE-627  |e rakwb 
041 |a eng 
100 1 |a Jang, Mi  |e verfasserin  |4 aut 
245 1 0 |a Critical factors to achieve low voltage- and capacitance-based organic field-effect transistors 
264 1 |c 2014 
336 |a Text  |b txt  |2 rdacontent 
337 |a ƒaComputermedien  |b c  |2 rdamedia 
338 |a ƒa Online-Ressource  |b cr  |2 rdacarrier 
500 |a Date Completed 12.08.2014 
500 |a Date Revised 30.09.2020 
500 |a published: Print-Electronic 
500 |a Citation Status PubMed-not-MEDLINE 
520 |a © 2013 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim. 
520 |a Hydrophobic organo-compatible but low-capacitance dielectrics (10.5 nFcm(-2) ), polystyrene-grafted SiO2 could induce surface-mediated large crystal grains of face-to-face stacked triethylsilylethynyl anthradithiophene (TES-ADT), producing more efficient charge-carrier transport, in comparison to μm-sized pentacene crystals containing a face-to-edge packing. Low-voltage operating TES-ADT OFETs showed good device performance (μFET ≈ 1.3 cm(2) V(-1) s(-1) , Vth ≈ 0.5 V, SS ≈ 0.2 V), as well as excellent device reliability 
650 4 |a Journal Article 
650 4 |a Research Support, Non-U.S. Gov't 
650 4 |a conjugation 
650 4 |a low-voltage operation 
650 4 |a organic field-effect transistors 
650 4 |a pentacene 
650 4 |a trap 
650 4 |a triethylsilylethynyl anthradithiophene (TES-ADT) 
700 1 |a Park, Ji Hoon  |e verfasserin  |4 aut 
700 1 |a Im, Seongil  |e verfasserin  |4 aut 
700 1 |a Kim, Se Hyun  |e verfasserin  |4 aut 
700 1 |a Yang, Hoichang  |e verfasserin  |4 aut 
773 0 8 |i Enthalten in  |t Advanced materials (Deerfield Beach, Fla.)  |d 1998  |g 26(2014), 2 vom: 15. Jan., Seite 288-92  |w (DE-627)NLM098206397  |x 1521-4095  |7 nnns 
773 1 8 |g volume:26  |g year:2014  |g number:2  |g day:15  |g month:01  |g pages:288-92 
856 4 0 |u http://dx.doi.org/10.1002/adma.201303388  |3 Volltext 
912 |a GBV_USEFLAG_A 
912 |a SYSFLAG_A 
912 |a GBV_NLM 
912 |a GBV_ILN_350 
951 |a AR 
952 |d 26  |j 2014  |e 2  |b 15  |c 01  |h 288-92