High-resolution thermal imaging with a combination of nano-focus X-ray diffraction and ultra-fast chip calorimetry
A microelectromechanical-systems-based calorimeter designed for use on a synchrotron nano-focused X-ray beamline is described. This instrument allows quantitative DC and AC calorimetric measurements over a broad range of heating/cooling rates (≤100000 K s(-1)) and temperature modulation frequencies...
Ausführliche Beschreibung
Bibliographische Detailangaben
| Veröffentlicht in: | Journal of synchrotron radiation. - 1994. - 21(2014), Pt 1 vom: 15. Jan., Seite 223-8
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| 1. Verfasser: |
Rosenthal, Martin
(VerfasserIn) |
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| Weitere Verfasser: |
Doblas, David,
Hernandez, Jaime J,
Odarchenko, Yaroslav I,
Burghammer, Manfred,
Di Cola, Emanuela,
Spitzer, Denis,
Antipov, A E,
Aldoshin, L S,
Ivanov, Dimitri A |
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| Format: | Online-Aufsatz
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| Sprache: | English |
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| Veröffentlicht: |
2014
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| Zugriff auf das übergeordnete Werk: | Journal of synchrotron radiation
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| Schlagworte: | Journal Article
indium
micro-focus X-ray diffraction
modulated differential scanning calorimetry
nanocalorimetry |
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