High-resolution thermal imaging with a combination of nano-focus X-ray diffraction and ultra-fast chip calorimetry

A microelectromechanical-systems-based calorimeter designed for use on a synchrotron nano-focused X-ray beamline is described. This instrument allows quantitative DC and AC calorimetric measurements over a broad range of heating/cooling rates (≤100000 K s(-1)) and temperature modulation frequencies...

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Détails bibliographiques
Publié dans:Journal of synchrotron radiation. - 1994. - 21(2014), Pt 1 vom: 15. Jan., Seite 223-8
Auteur principal: Rosenthal, Martin (Auteur)
Autres auteurs: Doblas, David, Hernandez, Jaime J, Odarchenko, Yaroslav I, Burghammer, Manfred, Di Cola, Emanuela, Spitzer, Denis, Antipov, A E, Aldoshin, L S, Ivanov, Dimitri A
Format: Article en ligne
Langue:English
Publié: 2014
Accès à la collection:Journal of synchrotron radiation
Sujets:Journal Article indium micro-focus X-ray diffraction modulated differential scanning calorimetry nanocalorimetry