Optical sectioning by wide-field photobleaching imprinting microscopy
We present a generic wide-field optical sectioning scheme, photobleaching imprinting microscopy (PIM), for depth-resolved cross-sectional fluorescence imaging. Wide-field PIM works by extracting a nonlinear component that depends on the excitation fluence as a result of photobleaching-induced fluore...
| Publié dans: | Applied physics letters. - 1998. - 103(2013), 18 vom: 28. Okt., Seite 183703 |
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| Auteur principal: | |
| Autres auteurs: | , , |
| Format: | Article |
| Langue: | English |
| Publié: |
2013
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| Accès à la collection: | Applied physics letters |
| Sujets: | Journal Article |