X-ray analysis of residual stress gradients in TiN coatings by a Laplace space approach and cross-sectional nanodiffraction : a critical comparison

Novel scanning synchrotron cross-sectional nanobeam and conventional laboratory as well as synchrotron Laplace X-ray diffraction methods are used to characterize residual stresses in exemplary 11.5 µm-thick TiN coatings. Both real and Laplace space approaches reveal a homogeneous tensile stress stat...

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Veröffentlicht in:	Journal of applied crystallography. - 1998. - 46(2013), Pt 5 vom: 01. Okt., Seite 1378-1385
1. Verfasser:	Stefenelli, Mario (VerfasserIn)
Weitere Verfasser:	Todt, Juraj, Riedl, Angelika, Ecker, Werner, Müller, Thomas, Daniel, Rostislav, Burghammer, Manfred, Keckes, Jozef
Format:	Aufsatz
Sprache:	English
Veröffentlicht:	2013
Zugriff auf das übergeordnete Werk:	Journal of applied crystallography
Schlagworte:	Journal Article Laplace methods TiN coatings X-ray diffraction cross-sectional nanodiffraction residual stress