Covariant description of X-ray diffraction from anisotropically relaxed epitaxial structures
A general theoretical approach to the description of epitaxial layers with essentially different cell parameters and in-plane relaxation anisotropy has been developed. A covariant description of relaxation in such structures has been introduced. An iteration method for evaluation of these parameters...
| Veröffentlicht in: | Journal of applied crystallography. - 1998. - 46(2013), Pt 4 vom: 01. Aug., Seite 919-925 |
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| 1. Verfasser: | |
| Weitere Verfasser: | , , , , |
| Format: | Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
2013
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| Zugriff auf das übergeordnete Werk: | Journal of applied crystallography |
| Schlagworte: | Journal Article epitaxial layers high-resolution X-ray diffraction relaxation parameters theoretical approach |