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231224s2013 xx |||||o 00| ||eng c |
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|a 10.1107/S0909049513018876
|2 doi
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|a eng
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1 |
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|a Takeuchi, Akihisa
|e verfasserin
|4 aut
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|a Three-dimensional phase-contrast X-ray microtomography with scanning-imaging X-ray microscope optics
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|c 2013
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|a Text
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|a ƒaComputermedien
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|a ƒa Online-Ressource
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|a Date Completed 25.02.2014
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|a Date Revised 21.10.2021
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|a published: Print-Electronic
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|a Citation Status PubMed-not-MEDLINE
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|a A three-dimensional (3D) X-ray tomographic micro-imaging system has been developed. The optical system is based on a scanning-imaging X-ray microscope (SIXM) optics, which is a hybrid system consisting of a scanning microscope optics with a one-dimensional (1D) focusing (line-focusing) device and an imaging microscope optics with a 1D objective. In the SIXM system, each 1D dataset of a two-dimensional (2D) image is recorded independently. An object is illuminated with a line-focused beam. Positional information of the region illuminated by the line-focused beam is recorded with the 1D imaging microscope optics as line-profile data. By scanning the object with the line focus, 2D image data are obtained. In the same manner as for a scanning microscope optics with a multi-pixel detector, imaging modes such as phase contrast and absorption contrast can be arbitrarily configured after the image data acquisition. By combining a tomographic scan method and the SIXM system, quantitative 3D imaging is performed. Results of a feasibility study of the SIXM for 3D imaging are shown
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|a Journal Article
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|a X-ray microscopy
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|a differential phase contrast
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|a tomography
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|a Uesugi, Kentaro
|e verfasserin
|4 aut
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| 700 |
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|a Suzuki, Yoshio
|e verfasserin
|4 aut
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| 773 |
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|i Enthalten in
|t Journal of synchrotron radiation
|d 1994
|g 20(2013), Pt 5 vom: 15. Sept., Seite 793-800
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|x 1600-5775
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|g volume:20
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|g day:15
|g month:09
|g pages:793-800
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|u http://dx.doi.org/10.1107/S0909049513018876
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