Density profile in thin films of polybutadiene on silicon oxide substrates : a TOF-NR study
We have investigated thin films from fully deuterated polybutadiene (PB-d6) on silicon substrates with the aim of detecting and characterizing a possible interphase in the polymer film near the substrate using time-of-flight neutron reflectometry (TOF-NR). As substrates, thermally oxidized silicon w...
Ausführliche Beschreibung
Bibliographische Detailangaben
Veröffentlicht in: | Langmuir : the ACS journal of surfaces and colloids. - 1992. - 29(2013), 34 vom: 27. Aug., Seite 10759-68
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1. Verfasser: |
Hoppe, E Tilo
(VerfasserIn) |
Weitere Verfasser: |
Sepe, Alessandro,
Haese-Seiller, Martin,
Moulin, Jean-François,
Papadakis, Christine M |
Format: | Online-Aufsatz
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Sprache: | English |
Veröffentlicht: |
2013
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Zugriff auf das übergeordnete Werk: | Langmuir : the ACS journal of surfaces and colloids
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Schlagworte: | Journal Article |