Limited propagation of lattice distortion in trilayer Langmuir-Blodgett films : correlation with mesoscopic structure

The structure of trilayer Langmuir-Blodgett (LB) films on oxidized silicon wafers has been investigated using grazing incidence X-ray diffraction at various incidence angles and atomic force microscopy (AFM). These films are formed by two behenic acid (BA) layers and a third monolayer of amphiphilic...

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Veröffentlicht in:	Langmuir : the ACS journal of surfaces and colloids. - 1992. - 29(2013), 35 vom: 03. Sept., Seite 11046-54
1. Verfasser:	Cantin, Sophie (VerfasserIn)
Weitere Verfasser:	Perrot, Françoise, Fontaine, Philippe, Goldmann, Michel
Format:	Online-Aufsatz
Sprache:	English
Veröffentlicht:	2013
Zugriff auf das übergeordnete Werk:	Langmuir : the ACS journal of surfaces and colloids
Schlagworte:	Journal Article