Characterizing ultrathin and thick organic layers by surface plasmon resonance three-wavelength and waveguide mode analysis
A three-wavelength angular-scanning surface plasmon resonance based analysis has been utilized for characterizing optical properties of organic nanometer-thick layers with a wide range of thicknesses. The thickness and refractive index were determined for sample layers with thicknesses ranging from...
Ausführliche Beschreibung
Bibliographische Detailangaben
| Veröffentlicht in: | Langmuir : the ACS journal of surfaces and colloids. - 1999. - 29(2013), 27 vom: 09. Juli, Seite 8561-71
|
|---|
| 1. Verfasser: |
Granqvist, Niko
(VerfasserIn) |
|---|
| Weitere Verfasser: |
Liang, Huamin,
Laurila, Terhi,
Sadowski, Janusz,
Yliperttula, Marjo,
Viitala, Tapani |
|---|
| Format: | Online-Aufsatz
|
|---|
| Sprache: | English |
|---|
| Veröffentlicht: |
2013
|
|---|
| Zugriff auf das übergeordnete Werk: | Langmuir : the ACS journal of surfaces and colloids
|
|---|
| Schlagworte: | Journal Article
Research Support, Non-U.S. Gov't
Polymers |
|---|