Non-contact AFM imaging in water using electrically driven cantilever vibration
An atomic force microscopy (AFM) imaging mode is presented that can simultaneously record surface topography and local electrical properties in aqueous solutions without mechanical contact between the AFM tip and the sample. The interaction between the electrically biased tip and the grounded sample...
| Veröffentlicht in: | Langmuir : the ACS journal of surfaces and colloids. - 1992. - 29(2013), 22 vom: 04. Juni, Seite 6762-9 |
|---|---|
| 1. Verfasser: | |
| Weitere Verfasser: | , |
| Format: | Online-Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
2013
|
| Zugriff auf das übergeordnete Werk: | Langmuir : the ACS journal of surfaces and colloids |
| Schlagworte: | Journal Article |
| Online verfügbar |
Volltext |