Angle-resolved XPS analysis and characterization of monolayer and multilayer silane films for DNA coupling to silica
We measure silane density and Sulfo-EMCS cross-linker coupling efficiency on aminosilane films by high-resolution X-ray photoelectron spectroscopy (XPS) and atomic force microscopy (AFM) measurements. We then characterize DNA immobilization and hybridization on these films by (32)P-radiometry. We fi...
Ausführliche Beschreibung
Bibliographische Detailangaben
| Veröffentlicht in: | Langmuir : the ACS journal of surfaces and colloids. - 1999. - 29(2013), 12 vom: 26. März, Seite 4057-67
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| 1. Verfasser: |
Shircliff, Rebecca A
(VerfasserIn) |
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| Weitere Verfasser: |
Stradins, Paul,
Moutinho, Helio,
Fennell, John,
Ghirardi, Maria L,
Cowley, Scott W,
Branz, Howard M,
Martin, Ina T |
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| Format: | Online-Aufsatz
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| Sprache: | English |
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| Veröffentlicht: |
2013
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| Zugriff auf das übergeordnete Werk: | Langmuir : the ACS journal of surfaces and colloids
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| Schlagworte: | Journal Article
Research Support, U.S. Gov't, Non-P.H.S.
(3-aminopropyl)dimethylethoxysilane
Cross-Linking Reagents
Phosphorus Radioisotopes
Propylamines
Silanes
Succinimides
Water
059QF0KO0R
mehr...
Silicon Dioxide
7631-86-9
DNA
9007-49-2
amino-propyl-triethoxysilane
L8S6UBW552 |
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