Spectrometer for hard X-ray free-electron laser based on diffraction focusing

X-ray free-electron lasers (XFELs) generate sequences of ultra-short spatially coherent pulses of X-ray radiation. A diffraction focusing spectrometer (DFS), which is able to measure the whole energy spectrum of the radiation of a single XFEL pulse with an energy resolution of ΔE/E 2 × 10(-6), is pr...

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Veröffentlicht in:	Journal of synchrotron radiation. - 1994. - 20(2013), Pt 2 vom: 21. März, Seite 258-65
1. Verfasser:	Kohn, V G (VerfasserIn)
Weitere Verfasser:	Gorobtsov, O Y, Vartanyants, I A
Format:	Online-Aufsatz
Sprache:	English
Veröffentlicht:	2013
Zugriff auf das übergeordnete Werk:	Journal of synchrotron radiation
Schlagworte:	Journal Article Research Support, Non-U.S. Gov't compound refractive lenses diffraction focusing spectrometer hard X-ray free-electron laser