A simultaneous multiple angle-wavelength dispersive X-ray reflectometer using a bent-twisted polychromator crystal
An X-ray reflectometer has been developed, which can simultaneously measure the whole specular X-ray reflectivity curve with no need for rotation of the sample, detector or monochromator crystal during the measurement. A bent-twisted crystal polychromator is used to realise a convergent X-ray beam w...
| Veröffentlicht in: | Journal of synchrotron radiation. - 1994. - 20(2013), Pt 1 vom: 01. Jan., Seite 80-8 |
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| 1. Verfasser: | |
| Weitere Verfasser: | , , |
| Format: | Online-Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
2013
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| Zugriff auf das übergeordnete Werk: | Journal of synchrotron radiation |
| Schlagworte: | Journal Article Research Support, Non-U.S. Gov't |
| Online verfügbar |
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