Characterization of mesoporous thin films by specular reflectance porosimetry
The pore size distribution of mesoporous thin films is herein investigated through a reliable and versatile technique coined specular reflectance porosimetry. This method is based on the analysis of the gradual shift of the optical response of a porous slab measured in quasi-normal reflection mode t...
Ausführliche Beschreibung
Bibliographische Detailangaben
| Veröffentlicht in: | Langmuir : the ACS journal of surfaces and colloids. - 1992. - 28(2012), 39 vom: 02. Okt., Seite 13777-82
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| 1. Verfasser: |
Hidalgo, Nuria
(VerfasserIn) |
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| Weitere Verfasser: |
López-López, Carmen,
Lozano, Gabriel,
Calvo, Mauricio E,
Míguez, Hernán |
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| Format: | Online-Aufsatz
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| Sprache: | English |
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| Veröffentlicht: |
2012
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| Zugriff auf das übergeordnete Werk: | Langmuir : the ACS journal of surfaces and colloids
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| Schlagworte: | Journal Article
titanium dioxide
15FIX9V2JP
Silicon Dioxide
7631-86-9
Titanium
D1JT611TNE |
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