Studying the kinetics of crystalline silicon nanoparticle lithiation with in situ transmission electron microscopy

Studying the kinetics of crystalline silicon nanoparticle lithiation with in situ transmission electron microscopy

Copyright © 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

Bibliographische Detailangaben
Veröffentlicht in:Advanced materials (Deerfield Beach, Fla.). - 1998. - 24(2012), 45 vom: 27. Nov., Seite 6034-41
1. Verfasser: McDowell, Matthew T (VerfasserIn)
Weitere Verfasser: Ryu, Ill, Lee, Seok Woo, Wang, Chongmin, Nix, William D, Cui, Yi
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2012
Zugriff auf das übergeordnete Werk:Advanced materials (Deerfield Beach, Fla.)
Schlagworte:Journal Article Research Support, Non-U.S. Gov't Research Support, U.S. Gov't, Non-P.H.S. Lithium 9FN79X2M3F Silicon Z4152N8IUI
Beschreibung
Zusammenfassung:Copyright © 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
In situ transmission electron microscopy (TEM) is used to study the electrochemical lithiation of high-capacity crystalline Si nanoparticles for use in Li-ion battery anodes. The lithiation reaction slows down as it progresses into the particle interior, and analysis suggests that this behavior is due not to diffusion limitation but instead to the influence of mechanical stress on the driving force for reaction
Beschreibung:Date Completed 01.05.2013
Date Revised 30.09.2020
published: Print-Electronic
Citation Status MEDLINE
ISSN:1521-4095
DOI:10.1002/adma.201202744