Local thermomechanical analysis of a microphase-separated thin lamellar PS-b-PEO film

We use atomic force microscopy (AFM) and hot tip AFM (HT-AFM) to thermophysically characterize a 30 nm thick film of poly(styrene-block-ethylene oxide), PS-b-PEO, and to modify its lamellar patterns having spacing of 39 ± 3 nm. AFM tip scans of the polymer film induce either abrasive surface pattern...

Ausführliche Beschreibung

Bibliographische Detailangaben
Veröffentlicht in:Langmuir : the ACS journal of surfaces and colloids. - 1992. - 28(2012), 37 vom: 18. Sept., Seite 13503-11
1. Verfasser: Rice, Reginald H (VerfasserIn)
Weitere Verfasser: Mokarian-Tabari, Parvaneh, King, William P, Szoszkiewicz, Robert
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2012
Zugriff auf das übergeordnete Werk:Langmuir : the ACS journal of surfaces and colloids
Schlagworte:Journal Article Polystyrenes polystyrene-b-poly(ethylene oxide) Polyethylene Glycols 3WJQ0SDW1A
LEADER 01000naa a22002652 4500
001 NLM22052470X
003 DE-627
005 20231224045640.0
007 cr uuu---uuuuu
008 231224s2012 xx |||||o 00| ||eng c
024 7 |a 10.1021/la302565s  |2 doi 
028 5 2 |a pubmed24n0735.xml 
035 |a (DE-627)NLM22052470X 
035 |a (NLM)22924663 
040 |a DE-627  |b ger  |c DE-627  |e rakwb 
041 |a eng 
100 1 |a Rice, Reginald H  |e verfasserin  |4 aut 
245 1 0 |a Local thermomechanical analysis of a microphase-separated thin lamellar PS-b-PEO film 
264 1 |c 2012 
336 |a Text  |b txt  |2 rdacontent 
337 |a ƒaComputermedien  |b c  |2 rdamedia 
338 |a ƒa Online-Ressource  |b cr  |2 rdacarrier 
500 |a Date Completed 24.01.2013 
500 |a Date Revised 01.12.2018 
500 |a published: Print-Electronic 
500 |a Citation Status MEDLINE 
520 |a We use atomic force microscopy (AFM) and hot tip AFM (HT-AFM) to thermophysically characterize a 30 nm thick film of poly(styrene-block-ethylene oxide), PS-b-PEO, and to modify its lamellar patterns having spacing of 39 ± 3 nm. AFM tip scans of the polymer film induce either abrasive surface patterns or nanoscale ripples, which depend upon the tip force, temperature, and number of scans. The evolution of the lamellar patterns is explained by the polymer film molecular structure and mode I crack propagation in the polymer combined with the stick-and-slip behavior of the AFM tip. The HT-AFM measurements at various tip-sample temperatures and scanning speeds yield several thermophysical quantities: the PEO melting temperature of 54 ± 12 °C, the PS glass transition temperature of 54 ± 12 °C, the PS-b-PEO specific heat of 3.6 ± 2.7 J g(-1) K(-1), the PEO melting enthalpy of 111 ± 88 J g(-1), and the free energy of Helmholtz for PEO unfolding (and melting) of 10(-20) J nm(-2). These quantities are obtained for PS-b-PEO volumes of 30,000 nm(3), which correspond to 30 ag of the polymer 
650 4 |a Journal Article 
650 7 |a Polystyrenes  |2 NLM 
650 7 |a polystyrene-b-poly(ethylene oxide)  |2 NLM 
650 7 |a Polyethylene Glycols  |2 NLM 
650 7 |a 3WJQ0SDW1A  |2 NLM 
700 1 |a Mokarian-Tabari, Parvaneh  |e verfasserin  |4 aut 
700 1 |a King, William P  |e verfasserin  |4 aut 
700 1 |a Szoszkiewicz, Robert  |e verfasserin  |4 aut 
773 0 8 |i Enthalten in  |t Langmuir : the ACS journal of surfaces and colloids  |d 1992  |g 28(2012), 37 vom: 18. Sept., Seite 13503-11  |w (DE-627)NLM098181009  |x 1520-5827  |7 nnns 
773 1 8 |g volume:28  |g year:2012  |g number:37  |g day:18  |g month:09  |g pages:13503-11 
856 4 0 |u http://dx.doi.org/10.1021/la302565s  |3 Volltext 
912 |a GBV_USEFLAG_A 
912 |a SYSFLAG_A 
912 |a GBV_NLM 
912 |a GBV_ILN_22 
912 |a GBV_ILN_350 
912 |a GBV_ILN_721 
951 |a AR 
952 |d 28  |j 2012  |e 37  |b 18  |c 09  |h 13503-11