Focused ion beam preparation of samples for X-ray nanotomography
The preparation of hard material samples with the necessary size and shape is critical to successful material analysis. X-ray nanotomography requires that samples are sufficiently thin for X-rays to pass through the sample during rotation for tomography. One method for producing samples that fit the...
Ausführliche Beschreibung
Bibliographische Detailangaben
| Veröffentlicht in: | Journal of synchrotron radiation. - 1994. - 19(2012), Pt 5 vom: 28. Sept., Seite 789-96
|
|---|
| 1. Verfasser: |
Lombardo, Jeffrey J
(VerfasserIn) |
|---|
| Weitere Verfasser: |
Ristau, Roger A,
Harris, William M,
Chiu, Wilson K S |
|---|
| Format: | Online-Aufsatz
|
|---|
| Sprache: | English |
|---|
| Veröffentlicht: |
2012
|
|---|
| Zugriff auf das übergeordnete Werk: | Journal of synchrotron radiation
|
|---|
| Schlagworte: | Journal Article
Research Support, U.S. Gov't, Non-P.H.S.
Ions |
|---|