Mechanical deformation of a SiGe island epitaxically grown on Si(001) was studied by a specially adapted atomic force microscope and nanofocused X-ray diffraction. The deformation was monitored during in situ mechanical loading by recording three-dimensional reciprocal-space maps around a selected B...
Détails bibliographiques
| Publié dans: | Journal of synchrotron radiation. - 1994. - 19(2012), Pt 5 vom: 05. Sept., Seite 688-94
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| Auteur principal: |
Cornelius, T W
(Auteur) |
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| Autres auteurs: |
Davydok, A,
Jacques, V L R,
Grifone, R,
Schülli, T,
Richard, M I,
Beutier, G,
Verdier, M,
Metzger, T H,
Pietsch, U,
Thomas, O |
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| Format: | Article en ligne
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| Langue: | English |
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| Publié: |
2012
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| Accès à la collection: | Journal of synchrotron radiation
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| Sujets: | Journal Article |
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