Segmentation, Inference and Classification of Partially Overlapping Nanoparticles
This paper presents a method that enables automated morphology analysis of partially overlapping nanoparticles in electron micrographs. In the undertaking of morphology analysis, three tasks appear necessary: separate individual particles from an agglomerate of overlapping nano-objects; infer the pa...
Ausführliche Beschreibung
Bibliographische Detailangaben
| Veröffentlicht in: | IEEE transactions on pattern analysis and machine intelligence. - 1979. - 35(2013), 3 vom: 01. März, Seite 669-81
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| 1. Verfasser: |
Park, Chiwoo
(VerfasserIn) |
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| Weitere Verfasser: |
Huang, Jianhua Z,
Ji, Jim X,
Ding, Yu |
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| Format: | Online-Aufsatz
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| Sprache: | English |
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| Veröffentlicht: |
2013
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| Zugriff auf das übergeordnete Werk: | IEEE transactions on pattern analysis and machine intelligence
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| Schlagworte: | Journal Article
Research Support, Non-U.S. Gov't
Research Support, U.S. Gov't, Non-P.H.S. |
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