Controlled positioning of nanoparticles on graphene by noninvasive AFM lithography
Atomic force microscopy is shown to be an excellent lithographic technique to directly deposit nanoparticles on graphene by capillary transport without any previous functionalization of neither the nanoparticles nor the graphene surface while preserving its integrity and conductivity properties. Mor...
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Bibliographische Detailangaben
| Veröffentlicht in: | Langmuir : the ACS journal of surfaces and colloids. - 1992. - 28(2012), 33 vom: 21. Aug., Seite 12400-9
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| 1. Verfasser: |
Bellido, Elena
(VerfasserIn) |
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| Weitere Verfasser: |
Ojea-Jiménez, Isaac,
Ghirri, Alberto,
Alvino, Christian,
Candini, Andrea,
Puntes, Victor,
Affronte, Marco,
Domingo, Neus,
Ruiz-Molina, Daniel |
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| Format: | Online-Aufsatz
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| Sprache: | English |
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| Veröffentlicht: |
2012
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| Zugriff auf das übergeordnete Werk: | Langmuir : the ACS journal of surfaces and colloids
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| Schlagworte: | Journal Article |
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