Locally enhanced dissolution rate as a probe for nanocontact-induced densification in oxide glasses
Atomic force microscopy (AFM) was used to characterize the surface damage (nanoindentations) effect on the chemical durability of glass surfaces (silica and soda-lime silicate glasses, WG). In basic solutions, an enhanced dissolution rate is reported and quantified at indentation sites (+10.5 nm/h a...
| Veröffentlicht in: | Langmuir : the ACS journal of surfaces and colloids. - 1992. - 28(2012), 29 vom: 24. Juli, Seite 10733-40 |
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| Format: | Online-Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
2012
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| Zugriff auf das übergeordnete Werk: | Langmuir : the ACS journal of surfaces and colloids |
| Schlagworte: | Journal Article |
| Online verfügbar |
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