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231224s2012 xx |||||o 00| ||eng c |
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|a 10.1107/S0909049512022637
|2 doi
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|a eng
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|a Kalinowski, Jarosław A
|e verfasserin
|4 aut
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|a The LaueUtil toolkit for Laue photocrystallography. II. Spot finding and integration
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|c 2012
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|a Text
|b txt
|2 rdacontent
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|a ƒaComputermedien
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|2 rdamedia
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|a ƒa Online-Ressource
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|2 rdacarrier
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|a Date Completed 18.10.2012
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|a Date Revised 21.10.2021
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|a published: Print-Electronic
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|a Citation Status PubMed-not-MEDLINE
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|a A spot-integration method is described which does not require prior indexing of the reflections. It is based on statistical analysis of the values from each of the pixels on successive frames, followed for each frame by morphological analysis to identify clusters of high value pixels which form an appropriate mask corresponding to a reflection peak. The method does not require prior assumptions such as fitting of a profile or definition of an integration box. The results are compared with those of the seed-skewness method which is based on minimizing the skewness of the intensity distribution within a peak's integration box. Applications in Laue photocrystallography are presented
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|a Journal Article
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|a Research Support, N.I.H., Extramural
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|a Research Support, U.S. Gov't, Non-P.H.S.
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|a Fournier, Bertrand
|e verfasserin
|4 aut
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| 700 |
1 |
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|a Makal, Anna
|e verfasserin
|4 aut
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| 700 |
1 |
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|a Coppens, Philip
|e verfasserin
|4 aut
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| 773 |
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|i Enthalten in
|t Journal of synchrotron radiation
|d 1994
|g 19(2012), Pt 4 vom: 15. Juli, Seite 637-46
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|x 1600-5775
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|g volume:19
|g year:2012
|g number:Pt 4
|g day:15
|g month:07
|g pages:637-46
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|u http://dx.doi.org/10.1107/S0909049512022637
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