Measuring picosecond excited-state lifetimes at synchrotron sources

A new analysis method for the short excited-state lifetime measurement of photosensitive species in crystals is described. Based on photocrystallographic techniques, this method is an alternative to spectroscopic methods and is also valid for non-luminescent excited species. Two different approaches...

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Veröffentlicht in:Journal of synchrotron radiation. - 1994. - 19(2012), Pt 4 vom: 15. Juli, Seite 497-502
1. Verfasser: Fournier, Bertrand (VerfasserIn)
Weitere Verfasser: Coppens, Philip
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2012
Zugriff auf das übergeordnete Werk:Journal of synchrotron radiation
Schlagworte:Journal Article Research Support, U.S. Gov't, Non-P.H.S.
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520 |a A new analysis method for the short excited-state lifetime measurement of photosensitive species in crystals is described. Based on photocrystallographic techniques, this method is an alternative to spectroscopic methods and is also valid for non-luminescent excited species. Two different approaches are described depending on the magnitude of the lifetime τ. For very short lifetimes below the width of the synchrotron pulse, an estimated τ can be obtained from the occurrence of the maximal system response as a function of the pump-probe delay time Δt. More precise estimates for both short and longer lifetimes can be achieved by a refinement of a model of the response as a function of the pump-probe delay time. The method also offers the possibility of the structure determination of excited species with lifetimes in the 40-100 ps range 
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