Electron transfer and ionic displacements at the origin of the 2D electron gas at the LAO/STO interface : direct measurements with atomic-column spatial resolution
Copyright © 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
| Veröffentlicht in: | Advanced materials (Deerfield Beach, Fla.). - 1998. - 24(2012), 29 vom: 02. Aug., Seite 3952-7 |
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| 1. Verfasser: | |
| Weitere Verfasser: | , , , , , , , , , |
| Format: | Online-Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
2012
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| Zugriff auf das übergeordnete Werk: | Advanced materials (Deerfield Beach, Fla.) |
| Schlagworte: | Journal Article Research Support, Non-U.S. Gov't Research Support, U.S. Gov't, Non-P.H.S. Aluminum Compounds Gases Ions Oxides Lanthanum 6I3K30563S Titanium mehr... |
| Zusammenfassung: | Copyright © 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim. Using state-of-the-art, aberration-corrected scanning transmission electron microscopy and electron energy loss spectroscopy with atomic-scale spatial resolution, experimental evidence for an intrinsic electronic reconstruction at the LAO/STO interface is shown. Simultaneous measurements of interfacial electron density and system polarization are crucial for establishing the highly debated origin of the 2D electron gas |
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| Beschreibung: | Date Completed 30.11.2012 Date Revised 30.09.2020 published: Print-Electronic Citation Status MEDLINE |
| ISSN: | 1521-4095 |
| DOI: | 10.1002/adma.201200667 |