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231224s2012 xx |||||o 00| ||eng c |
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|a 10.1002/adma.201200257
|2 doi
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|a pubmed24n0719.xml
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|a (DE-627)NLM215834690
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|a (NLM)22378596
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|a DE-627
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|a eng
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|a Nakayama, Tomonobu
|e verfasserin
|4 aut
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|a Development and application of multiple-probe scanning probe microscopes
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|c 2012
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|a Text
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|a ƒaComputermedien
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|2 rdamedia
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|a ƒa Online-Ressource
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|2 rdacarrier
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|a Date Completed 23.07.2012
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|a Date Revised 30.09.2020
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|a published: Print-Electronic
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|a Citation Status MEDLINE
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|a Copyright © 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
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|a In the research of advanced materials based on nanoscience and nanotechnology, it is often desirable to measure nanoscale local electrical conductivity at a designated position of a given sample. For this purpose, multiple-probe scanning probe microscopes (MP-SPMs), in which two, three or four scanning tunneling microscope (STM) or atomic force microscope (AFM) probes are operated independently, have been developed. Each probe in an MP-SPM is used not only for observing high-resolution STM or AFM images but also for forming an electrical contact enabling nanoscale local electrical conductivity measurement. The world's first double-probe STM (DP-STM) developed by the authors, which was subsequently modified to a triple-probe STM (TP-STM), has been used to measure the conductivities of one-dimensional metal nanowires and carbon nanotubes and also two-dimensional molecular films. A quadruple-probe STM (QP-STM) has also been developed and used to measure the conductivity of two-dimensional molecular films without the ambiguity of contact resistance between the probe and sample. Moreover, a quadruple-probe AFM (QP-AFM) with four conductive tuning-fork-type self-detection force sensing probes has been developed to measure the conductivity of a nanostructure on an insulating substrate. A general-purpose computer software to control four probes at the same time has also been developed and used in the operation of the QP-AFM. These developments and applications of MP-SPMs are reviewed in this paper
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|a Journal Article
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|a Metals
|2 NLM
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|a Nanotubes, Carbon
|2 NLM
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| 700 |
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|a Kubo, Osamu
|e verfasserin
|4 aut
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|a Shingaya, Yoshitaka
|e verfasserin
|4 aut
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| 700 |
1 |
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|a Higuchi, Seiji
|e verfasserin
|4 aut
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|a Hasegawa, Tsuyoshi
|e verfasserin
|4 aut
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| 700 |
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|a Jiang, Chun-Sheng
|e verfasserin
|4 aut
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| 700 |
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|a Okuda, Taichi
|e verfasserin
|4 aut
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| 700 |
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|a Kuwahara, Yuji
|e verfasserin
|4 aut
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| 700 |
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|a Takami, Kazuhiro
|e verfasserin
|4 aut
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| 700 |
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|a Aono, Masakazu
|e verfasserin
|4 aut
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| 773 |
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|i Enthalten in
|t Advanced materials (Deerfield Beach, Fla.)
|d 1998
|g 24(2012), 13 vom: 03. Apr., Seite 1675-92
|w (DE-627)NLM098206397
|x 1521-4095
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|g volume:24
|g year:2012
|g number:13
|g day:03
|g month:04
|g pages:1675-92
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|u http://dx.doi.org/10.1002/adma.201200257
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