Moiré pattern from a multiple Bragg-Laue interferometer

In X-ray section topography of Si 220 diffraction in a multiple Bragg-Laue mode, a moiré pattern is observed when the incident beam is divided into two parts by inserting a platinum wire in the middle of the beam. The moiré pattern can be explained by the summation of two interference fringes corres...

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Veröffentlicht in:Journal of synchrotron radiation. - 1994. - 19(2012), Pt 1 vom: 21. Jan., Seite 101-5
1. Verfasser: Hirano, Kenji (VerfasserIn)
Weitere Verfasser: Fukamachi, Tomoe, Kanematsu, Yoshinobu, Jongsukswat, Sukswat, Negishi, Riichirou, Ju, Dongying, Hirano, Keiichi, Kawamura, Takaaki
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2012
Zugriff auf das übergeordnete Werk:Journal of synchrotron radiation
Schlagworte:Journal Article Research Support, Non-U.S. Gov't
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520 |a In X-ray section topography of Si 220 diffraction in a multiple Bragg-Laue mode, a moiré pattern is observed when the incident beam is divided into two parts by inserting a platinum wire in the middle of the beam. The moiré pattern can be explained by the summation of two interference fringes corresponding to the two incident beams. The coherency of the X-rays from the bending-magnet beamline is estimated using the moiré pattern 
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700 1 |a Jongsukswat, Sukswat  |e verfasserin  |4 aut 
700 1 |a Negishi, Riichirou  |e verfasserin  |4 aut 
700 1 |a Ju, Dongying  |e verfasserin  |4 aut 
700 1 |a Hirano, Keiichi  |e verfasserin  |4 aut 
700 1 |a Kawamura, Takaaki  |e verfasserin  |4 aut 
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