A scanning Kelvin probe for synchrotron investigations : the in situ detection of radiation-induced potential changes
A wide range of high-performance X-ray surface/interface characterization techniques are implemented nowadays at every synchrotron radiation source. However, these techniques are not always `non-destructive' because possible beam-induced electronic or structural changes may occur during X-ray i...
Ausführliche Beschreibung
Bibliographische Detailangaben
Veröffentlicht in: | Journal of synchrotron radiation. - 1994. - 19(2012), Pt 1 vom: 21. Jan., Seite 48-53
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1. Verfasser: |
Salgin, Bekir
(VerfasserIn) |
Weitere Verfasser: |
Vogel, Dirk,
Pontoni, Diego,
Schröder, Heiko,
Schönberger, Bernd,
Stratmann, Martin,
Reichert, Harald,
Rohwerder, Michael |
Format: | Online-Aufsatz
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Sprache: | English |
Veröffentlicht: |
2012
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Zugriff auf das übergeordnete Werk: | Journal of synchrotron radiation
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Schlagworte: | Journal Article |