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231224s2011 xx |||||o 00| ||eng c |
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|a 10.1021/la203434w
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|a eng
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|a Killgore, J P
|e verfasserin
|4 aut
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|a Viscoelastic property mapping with contact resonance force microscopy
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|c 2011
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|a Text
|b txt
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|a ƒaComputermedien
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|a Date Completed 27.03.2012
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|a Date Revised 29.11.2011
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|a published: Print-Electronic
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|a Citation Status PubMed-not-MEDLINE
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|a © 2011 American Chemical Society
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|a We demonstrate the accurate nanoscale mapping of near-surface loss and storage moduli on a polystyrene-polypropylene blend with contact resonance force microscopy (CR-FM). These viscoelastic properties are extracted from spatially resolved maps of the contact resonance frequency and quality factor of the AFM cantilever. We consider two methods of data acquisition: (i) discrete stepping between mapping points and (ii) continuous scanning. For point mapping and low-speed scanning, the values of the relative loss and storage modulus are in good agreement with the time-temperature superposition of low-frequency dynamic mechanical analysis measurements to the high frequencies probed by CR-FM
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|a Journal Article
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|a Yablon, D G
|e verfasserin
|4 aut
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|a Tsou, A H
|e verfasserin
|4 aut
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| 700 |
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|a Gannepalli, A
|e verfasserin
|4 aut
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1 |
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|a Yuya, P A
|e verfasserin
|4 aut
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|a Turner, J A
|e verfasserin
|4 aut
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|a Proksch, R
|e verfasserin
|4 aut
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|a Hurley, D C
|e verfasserin
|4 aut
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|i Enthalten in
|t Langmuir : the ACS journal of surfaces and colloids
|d 1985
|g 27(2011), 23 vom: 06. Dez., Seite 13983-7
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|g volume:27
|g year:2011
|g number:23
|g day:06
|g month:12
|g pages:13983-7
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|u http://dx.doi.org/10.1021/la203434w
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