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231224s2011 xx |||||o 00| ||eng c |
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|a 10.1107/S0909049511034418
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|a pubmed24n0707.xml
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|a (DE-627)NLM212216805
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|a (NLM)21997912
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|a DE-627
|b ger
|c DE-627
|e rakwb
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|a eng
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|a Muro, Takayuki
|e verfasserin
|4 aut
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|a Development of a soft X-ray angle-resolved photoemission system applicable to 100 µm crystals
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|c 2011
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|a Text
|b txt
|2 rdacontent
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|a ƒaComputermedien
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|2 rdamedia
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|a ƒa Online-Ressource
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|2 rdacarrier
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|a Date Completed 08.02.2012
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|a Date Revised 20.10.2021
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|a published: Print-Electronic
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|a Citation Status PubMed-not-MEDLINE
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|a A system for angle-resolved photoemission spectroscopy (ARPES) of small single crystals with sizes down to 100 µm has been developed. Soft X-ray synchrotron radiation with a spot size of ∼40 µm × 65 µm at the sample position is used for the excitation. Using this system an ARPES measurement has been performed on a Si crystal of size 120 µm × 100 µm × 80 µm. The crystal was properly oriented on a sample stage by measuring the Laue spots. The crystal was cleaved in situ with a microcleaver at 100 K. The cleaved surface was adjusted to the beam spot using an optical microscope. Consequently, clear band dispersions along the Γ-X direction reflecting the bulk electronic states were observed with a photon energy of 879 eV
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|a Journal Article
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|a Research Support, Non-U.S. Gov't
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|a Kato, Yukako
|e verfasserin
|4 aut
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|a Matsushita, Tomohiro
|e verfasserin
|4 aut
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|a Kinoshita, Toyohiko
|e verfasserin
|4 aut
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|a Watanabe, Yoshio
|e verfasserin
|4 aut
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|a Okazaki, Hiroyuki
|e verfasserin
|4 aut
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|a Yokoya, Takayoshi
|e verfasserin
|4 aut
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|a Sekiyama, Akira
|e verfasserin
|4 aut
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|a Suga, Shigemasa
|e verfasserin
|4 aut
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|i Enthalten in
|t Journal of synchrotron radiation
|d 1994
|g 18(2011), Pt 6 vom: 04. Nov., Seite 879-84
|w (DE-627)NLM09824129X
|x 1600-5775
|7 nnns
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|g volume:18
|g year:2011
|g number:Pt 6
|g day:04
|g month:11
|g pages:879-84
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|u http://dx.doi.org/10.1107/S0909049511034418
|3 Volltext
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|d 18
|j 2011
|e Pt 6
|b 04
|c 11
|h 879-84
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