Carbon contamination of soft X-ray beamlines : dramatic anti-reflection coating effects observed in the 1 keV photon energy region
Carbon contamination is a general problem of under-vacuum optics submitted to high fluence. In soft X-ray beamlines carbon deposit on optics is known to absorb and scatter radiation close to the C K-edge (280 eV), forbidding effective measurements in this spectral region. Here the observation of str...
| Publié dans: | Journal of synchrotron radiation. - 1994. - 18(2011), Pt 5 vom: 21. Sept., Seite 761-4 |
|---|---|
| Auteur principal: | |
| Autres auteurs: | , , , , , , , , , , |
| Format: | Article en ligne |
| Langue: | English |
| Publié: |
2011
|
| Accès à la collection: | Journal of synchrotron radiation |
| Sujets: | Journal Article |
| Résumé: | Carbon contamination is a general problem of under-vacuum optics submitted to high fluence. In soft X-ray beamlines carbon deposit on optics is known to absorb and scatter radiation close to the C K-edge (280 eV), forbidding effective measurements in this spectral region. Here the observation of strong reflectivity losses is reported related to carbon deposition at much higher energies around 1000 eV, where carbon absorptivity is small. It is shown that the observed effect can be modelled as a destructive interference from a homogeneous carbon thin film |
|---|---|
| Description: | Date Completed 27.12.2011 Date Revised 24.08.2011 published: Print-Electronic Citation Status PubMed-not-MEDLINE |
| ISSN: | 1600-5775 |
| DOI: | 10.1107/S0909049511023119 |