Effect of water contact on the density distributions of thin supported polymer films investigated by an X-ray reflectivity method
The diffusion processes of water molecules into polymer films (PMMA/PS homopolymers and random copolymers) in contact with liquid water were investigated using gravimetric methods and X-ray reflectivity (XRR) analysis. Methods of water contact and XRR measurement were designed for studying the syste...
| Veröffentlicht in: | Langmuir : the ACS journal of surfaces and colloids. - 1992. - 26(2010), 23 vom: 07. Dez., Seite 18483-90 |
|---|---|
| 1. Verfasser: | |
| Weitere Verfasser: | , , |
| Format: | Online-Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
2010
|
| Zugriff auf das übergeordnete Werk: | Langmuir : the ACS journal of surfaces and colloids |
| Schlagworte: | Journal Article |
| Zusammenfassung: | The diffusion processes of water molecules into polymer films (PMMA/PS homopolymers and random copolymers) in contact with liquid water were investigated using gravimetric methods and X-ray reflectivity (XRR) analysis. Methods of water contact and XRR measurement were designed for studying the systems in the nonequilibrium state of diffusion. Gravimetric measurements confirmed the Fickian diffusion behavior of films in contact with water. Vertical density distributions in PMMA and methylmethacrylate-rich copolymer films demonstrate the existence of a water-rich layer at the interface. However, with further absorption of water into the film, the overall density increased throughout the film. The results suggest that the diffusion of water into the polymer film occurs to recover density uniformity with a high concentration of water molecules at the surface. Some XRR data for the PS- and styrene-rich copolymer films could not be fit and converted to a vertical density distribution because of their huge diffusion coefficients. However, the reflectivity curves for these films and the vertical density distribution after sufficient water contact suggested that the surfaces of these films were commonly diffused after water contact. Atomic force microscopy (AFM) analysis demonstrated that the surface roughness of these films actually increased with water content |
|---|---|
| Beschreibung: | Date Completed 06.04.2011 Date Revised 30.11.2010 published: Print-Electronic Citation Status PubMed-not-MEDLINE |
| ISSN: | 1520-5827 |
| DOI: | 10.1021/la1035085 |