Multi-pinhole SPECT Imaging with Silicon Strip Detectors

Silicon double-sided strip detectors offer outstanding instrinsic spatial resolution with reasonable detection efficiency for iodine-125 emissions. This spatial resolution allows for multiple-pinhole imaging at low magnification, minimizing the problem of multiplexing. We have conducted imaging stud...

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Veröffentlicht in:IEEE transactions on nuclear science. - 1988. - 56(2009), 3 vom: 16. Juni, Seite 646-652
1. Verfasser: Peterson, Todd E (VerfasserIn)
Weitere Verfasser: Shokouhi, Sepideh, Furenlid, Lars R, Wilson, Donald W
Format: Aufsatz
Sprache:English
Veröffentlicht: 2009
Zugriff auf das übergeordnete Werk:IEEE transactions on nuclear science
Schlagworte:Journal Article
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520 |a Silicon double-sided strip detectors offer outstanding instrinsic spatial resolution with reasonable detection efficiency for iodine-125 emissions. This spatial resolution allows for multiple-pinhole imaging at low magnification, minimizing the problem of multiplexing. We have conducted imaging studies using a prototype system that utilizes a detector of 300-micrometer thickness and 50-micrometer strip pitch together with a 23-pinhole collimator. These studies include an investigation of the synthetic-collimator imaging approach, which combines multiple-pinhole projections acquired at multiple magnifications to obtain tomographic reconstructions from limited-angle data using the ML-EM algorithm. Sub-millimeter spatial resolution was obtained, demonstrating the basic validity of this approach 
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700 1 |a Furenlid, Lars R  |e verfasserin  |4 aut 
700 1 |a Wilson, Donald W  |e verfasserin  |4 aut 
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