Radiation dose optimized lateral expansion of the field of view in synchrotron radiation X-ray tomographic microscopy

Volumetric data at micrometer level resolution can be acquired within a few minutes using synchrotron-radiation-based tomographic microscopy. The field of view along the rotation axis of the sample can easily be increased by stacking several tomograms, allowing the investigation of long and thin obj...

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Détails bibliographiques
Publié dans:Journal of synchrotron radiation. - 1994. - 17(2010), 5 vom: 17. Sept., Seite 590-9
Auteur principal: Haberthür, David (Auteur)
Autres auteurs: Hintermüller, Christoph, Marone, Federica, Schittny, Johannes C, Stampanoni, Marco
Format: Article en ligne
Langue:English
Publié: 2010
Accès à la collection:Journal of synchrotron radiation
Sujets:Journal Article Research Support, Non-U.S. Gov't