Radiation dose optimized lateral expansion of the field of view in synchrotron radiation X-ray tomographic microscopy
Volumetric data at micrometer level resolution can be acquired within a few minutes using synchrotron-radiation-based tomographic microscopy. The field of view along the rotation axis of the sample can easily be increased by stacking several tomograms, allowing the investigation of long and thin obj...
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Détails bibliographiques
Publié dans: | Journal of synchrotron radiation. - 1994. - 17(2010), 5 vom: 17. Sept., Seite 590-9
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Auteur principal: |
Haberthür, David
(Auteur) |
Autres auteurs: |
Hintermüller, Christoph,
Marone, Federica,
Schittny, Johannes C,
Stampanoni, Marco |
Format: | Article en ligne
|
Langue: | English |
Publié: |
2010
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Accès à la collection: | Journal of synchrotron radiation
|
Sujets: | Journal Article
Research Support, Non-U.S. Gov't |