Optical properties of poly(ferrocenylsilane) multilayer thin films
Spectroscopic ellipsometry has been used to investigate the optical properties of poly(ferrocenylsilane) polyion multilayer thin films in the visible and near-infrared range of the spectrum. The thin films were deposited using the layer-by-layer assembly process. Films with thicknesses of up to 55 n...
| Veröffentlicht in: | Langmuir : the ACS journal of surfaces and colloids. - 1985. - 26(2010), 17 vom: 07. Sept., Seite 14177-81 |
|---|---|
| 1. Verfasser: | |
| Weitere Verfasser: | , , , |
| Format: | Online-Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
2010
|
| Zugriff auf das übergeordnete Werk: | Langmuir : the ACS journal of surfaces and colloids |
| Schlagworte: | Journal Article Research Support, Non-U.S. Gov't Ferrous Compounds Membranes, Artificial Silanes poly(ferrocenylsilane) |
| Zusammenfassung: | Spectroscopic ellipsometry has been used to investigate the optical properties of poly(ferrocenylsilane) polyion multilayer thin films in the visible and near-infrared range of the spectrum. The thin films were deposited using the layer-by-layer assembly process. Films with thicknesses of up to 55 nm were fabricated stepwise from polyelectrolyte solutions with a controlled ionic strength. These films allow an accurate characterization of the optical properties of poly(ferrocenylsilane) polyion layers. We show that the complex refractive index can be described by a simple Cauchy model. Refractive index values vary over the spectral range from 1.53 (near-infrared) to 1.8 (ultraviolet) |
|---|---|
| Beschreibung: | Date Completed 27.12.2010 Date Revised 02.09.2010 published: Print Citation Status MEDLINE |
| ISSN: | 1520-5827 |
| DOI: | 10.1021/la101583t |