Depletion of PCBM at the cathode interface in P3HT/PCBM thin films as quantified via neutron reflectivity measurements

Depletion of PCBM at the cathode interface in P3HT/PCBM thin films as quantified via neutron reflectivity measurements

Bibliographische Detailangaben
Veröffentlicht in:Advanced materials (Deerfield Beach, Fla.). - 1998. - 22(2010), 22 vom: 11. Juni, Seite 2444-7
1. Verfasser: Parnell, Andrew J (VerfasserIn)
Weitere Verfasser: Dunbar, Alan D F, Pearson, Andrew J, Staniec, Paul A, Dennison, Andrew J C, Hamamatsu, Hiroshi, Skoda, Maximilian W A, Lidzey, David G, Jones, Richard A L
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2010
Zugriff auf das übergeordnete Werk:Advanced materials (Deerfield Beach, Fla.)
Schlagworte:Journal Article Research Support, Non-U.S. Gov't (6,6)-phenyl C61-butyric acid methyl ester Fullerenes Thiophenes poly(3-hexylthiophene)
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700 1 |a Pearson, Andrew J  |e verfasserin  |4 aut 
700 1 |a Staniec, Paul A  |e verfasserin  |4 aut 
700 1 |a Dennison, Andrew J C  |e verfasserin  |4 aut 
700 1 |a Hamamatsu, Hiroshi  |e verfasserin  |4 aut 
700 1 |a Skoda, Maximilian W A  |e verfasserin  |4 aut 
700 1 |a Lidzey, David G  |e verfasserin  |4 aut 
700 1 |a Jones, Richard A L  |e verfasserin  |4 aut 
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