Embedded microstructures by electric-field-induced pattern formation in interacting thin layers

Electric-field-induced interfacial instabilities and pattern formation in a pair of interacting thin films are analyzed on the basis of linear stability analysis and long-wave nonlinear simulations. The films are coated onto two parallel plate electrodes and separated by an air gap between them. A l...

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Bibliographische Detailangaben
Veröffentlicht in:Langmuir : the ACS journal of surfaces and colloids. - 1992. - 26(2010), 13 vom: 06. Juli, Seite 10943-52
1. Verfasser: Srivastava, Samanvaya (VerfasserIn)
Weitere Verfasser: Bandyopadhyay, Dipankar, Sharma, Ashutosh
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2010
Zugriff auf das übergeordnete Werk:Langmuir : the ACS journal of surfaces and colloids
Schlagworte:Journal Article Research Support, Non-U.S. Gov't Membranes, Artificial